Advantest Unveils MTe - Unified, Scalable Test Platform for Power Semiconductor Devices

Executive Summary

• Advantest Corporation announced the launch of its new MTe power test platform, targeting the rapidly expanding power‑semiconductor market.
• The MTe system features a modular hardware architecture, distributed computing for high‑parallel testing, and capabilities up to 10 kA with support for wide‑bandgap devices (SiC, GaN).
• Early customer evaluations in automotive and industrial applications report significant productivity and throughput improvements versus legacy testers.

Key Details

• Platform Name: MTe power test platform – “MTe Complete Solution.”
• Target Markets: Automotive, industrial, renewable energy, telecommunications, data‑center infrastructure; specifically for SiC, GaN, IPM, and IPD devices.
• Technical Highlights:
• Modular, scalable hardware architecture enabling flexible system expansion.
• Distributed computing architecture delivering high‑parallel multisite test efficiency.
• High‑bandwidth capture, best‑in‑class gate‑driver control, dynamic (short‑circuit) testing up to 10 kA.
• Flexible high‑voltage digital capabilities and support for digital IP cores on power devices.
• Operational Benefits: Significant footprint reduction and optimized resource distribution without performance degradation; enables seamless transition from R&D to high‑volume manufacturing.
• Availability: Platform is now available worldwide, with early customer evaluations confirming productivity gains over legacy testers.
• Quote: “The MTe concept embodies our vision of making test easy by being scalable, flexible and sustainable,” said Fabio Marino, Managing Director, CREA (Advantest Group Company).

Notable Quotes

• Fabio Marino: “We provide our customers with a unified test solution that evolves with their production requirements, enabling a seamless transition from R&D to high‑volume manufacturing, ensuring the highest levels of performance and reliability.”