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Production / Operations

Advantest Unveils T2000 AiR2X Air-Cooled SoC and Power Analog Test Solution

6857 · Price

Executive Summary

  • Advantest introduced the T2000 AiR2X, a next‑generation air‑cooled semiconductor test system that delivers twice the test resources of its predecessor while maintaining low power and cooling requirements.
  • The new platform is fully compatible with existing T2000 systems, supports up to 12 measurement modules (including high‑precision DC and automotive testing up to 320 V), and features a multisite controller that cuts test time in volume production.
  • General availability is slated for later this month, with initial device evaluations already confirming broad applicability across industrial MCUs, consumer ASICs, automotive battery‑monitoring ICs, and power analog applications.

Key Details

  • Product Name: T2000 AiR2X (air‑cooled SoC and power‑analog test solution).
  • Performance Gains: Provides twice the test resources of the prior T2000 AiR system; doubles resource capacity per floor area.
  • Compatibility: Fully compatible with conventional T2000 test systems; uses the same program environment and RECT550 performance board.
  • Measurement Capability: Supports up to 12 measurement modules, including functional/SCAN test, high‑precision DC testing, and automotive device DC testing up to 320 V.
  • Multisite Controller: Unique function reduces test time during volume production runs.
  • Rapid Development Kit (RDK): Accelerates program creation and debugging, shortening platform migration and implementation timelines.
  • Target Applications: Industrial micro‑controllers, consumer ASICs, automotive battery‑monitoring ICs, mobile device power analog circuits, and other high‑pin‑count SoCs.
  • Availability: General availability expected later in December 2025.
  • Marketing Presence: Demonstrations scheduled at SEMICON Japan (Booth E4346), Tokyo Big Sight, 17‑19 December 2025.

Notable Quotes

“The T2000 AiR2X and high‑density, high‑pin‑count V93000 create a unified test solution that covers the full spectrum of SoCs—from air‑cooled segments to large‑scale digitally rich devices… Together, this complementary pair reduces SoC deployment costs and environmental impact…” – Toshiaki Adachi, Leader, T2000 Product Unit, Advantest.

Read the original news release →

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